Description

Updated to reflect the major developments in field of VLSI interconnections over the past decade, this Second Edition of High-Speed VLSI Interconnections includes new sections on Parasitic Inductances, Nanotechnology circuit interconnects, Electromigrations in the copper interconnections, and Optical Interconnections.

This Second Edition focuses on emerging topics and advances in the field of VLSI interconnections

In the decade since High-Speed VLSI Interconnections was first published, several major developments have taken place in the field. Now, updated to reflect these advancements, this Second Edition includes new information on copper interconnections, nanotechnology circuit interconnects, electromigration in the copper interconnections, parasitic inductances, and RLC models for comprehensive analysis of interconnection delays and crosstalk.

Each chapter is designed to exist independently or as a part of one coherent unit, and several appropriate exercises are provided at the end of each chapter, challenging the reader to gain further insight into the contents being discussed. Chapter subjects include:

• Preliminary Concepts

• Parasitic Resistances, Capacitances, and Inductances

• Interconnection Delays

• Crosstalk Analysis

• Electromigration-Induced Failure Analysis

• Future Interconnections

High-Speed VLSI Interconnections, Second Edition is an indispensable reference for high-speed VLSI designers, RF circuit designers, and advanced students of electrical engineering.

This Second Edition focuses on emerging topics and advances in the field of VLSI interconnections In the decade since High-Speed VLSI Interconnections was first published, several major developments have taken place in the field. Now, updated to reflect these advancements, this Second Edition includes new information on copper interconnections, nanotechnology circuit interconnects, electromigration in the copper interconnections, parasitic inductances, and RLC models for comprehensive analysis of interconnection delays and crosstalk. Each chapter is designed to exist independently or as a part of one coherent unit, and several appropriate exercises are provided at the end of each chapter, challenging the reader to gain further insight into the contents being discussed. Chapter subjects include: * Preliminary Concepts * Parasitic Resistances, Capacitances, and Inductances * Interconnection Delays * Crosstalk Analysis * Electromigration-Induced Failure Analysis * Future Interconnections High-Speed VLSI Interconnections, Second Edition is an indispensable reference for high-speed VLSI designers, RF circuit designers, and advanced students of electrical engineering.

Langue

en

Version

Couverture rigide

Date de sortie initiale

05 octobre 2007

Nombre de pages

432

Illustrations

Non

Personnes impliquées

Auteur principal

Ashok K Goel

Editeur principal

WILQ

Informations sur le fabricant

Nom du fabricant

Easy Access System Europe Oü, 16879218

Adresse du fabricant

– 10621 – – EE

Adresse électronique du fabricant

gpsr.requests@easproject.com

Autres spécifications

Hauteur de l’emballage

32 mm

Hauteur du produit

32 mm

Largeur d’emballage

165 mm

Largeur du produit

165 mm

Livre d‘étude

Oui

Longueur d’emballage

241 mm

Longueur du produit

241 mm

Poids de l’emballage

726 g

Police de caractères extra large

Non

Édition

2

EAN

EAN

9780471780465

Sécurité des produits

Opérateur économique responsable dans l’UE

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Catégories

Technologie et architecture

Technologie de communication

Électrotechnique

Chaînes électriques et composants

Livres

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Livre

Disponibilité

Disponible à l’adresse suivante

Langue

Anglais

Type de livre

Hardcover